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Copyright:Jiangyin NPD Machinery Co., Ltd.     苏ICP备18054409号 

About the probe table

Industry news
2019/01/15 10:50
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Purpose of probe table:
The main purpose of the manual probe table is to provide a test platform for the electrical parameter test of the semiconductor chip. The probe table can absorb chips of variou
Purpose of probe table:
The main purpose of the manual probe table is to provide a test platform for the electrical parameter test of the semiconductor chip. The probe table can absorb chips of various specifications, and provide multiple adjustable test pins and probe pedestal. With the measuring instrument, the voltage, current, resistance and capacitance voltage characteristic curve of the integrated circuit can be tested. It is suitable for scientific research analysis, spot check test and so on.
How to use the probe table:
1. Load the sample into the vacuum chuck and open the vacuum valve control switch, so that the sample can be safely and firmly adsorbed on the chuck.
2. Move the chuck platform with the control knob on the X /Y axis to see the sample clearly under the focus of the low-power objective lens of the microscope.
3. Switch the microscope to high magnification objective lens, find the spot to be measured under high magnification, fine-tune the microscope focus and sample x-y, and adjust the image clearly, with the measuring point at the center of the microscope field of view.
4. Specific position to confirm good, then adjust the position of the probe, the probe after installed eye view to probe will be moved to the next to close to the location of the specific, to use the probe more X - Y - Z three tuning knob, slowly remove the probe to be measuring point, actions need to be careful and slow at this time, to prevent excessive action of hitting chip, when the probe tip dangling in was over the station, can use first Y knob to move forward a little, a probe to use the Z axis knob to knit, finally use the X axis sliding around knob, observe whether there is a little scratch, prove whether have contact.
5. After the tip and the measured point are in good contact, the test can be started with the connected test equipment.
Troubleshooting common problems
You may encounter some problems when using this instrument. The following table lists common failures and solutions.
Symptoms may cause a solution
The image becomes blurred after moving the sample
The sample table is not level
Sample is uneven
The field of view of the microscope is not bright enough, and the edge cut or the image converter is not in the position to transfer the converter to the position
The rotating disc of the endoscope is not at the positioning position
Insufficient illumination to adjust the brightness of the light source or to increase the aperture of the light column
The eyepiece was not fitted with the eyepiece
There is no objective lens mounted on the objective lens
The endoscope of the eyepiece, objective, and endoscope is cleaned
The aperture bar is too large or too small to adjust the aperture bar
The focusing handwheel is not properly adjusted
Sample with cover glass and other media removed cover glass and other media
While the image is clear, blur the sample and tilt it flat or adjust the level of the sample table
The objective lens is not screwed tightly
The pupil distance of the binocular head and the operator do not match to adjust the pupil distance of the binocular head
The ocular vision is not adjusted correctly
Do not adjust the brightness of light source or aperture properly
Maintenance and maintenance
1. Avoid collision: during the installation and operation of CS probe table, collision should be avoided. The placement of the body should be flat, not inclined or sideways.
2. Transportation of instruments: please unplug the power cord before transporting instruments.
Special packing boxes shall be used for instrument transport to avoid touching any moving parts of the probe table.
3. Storage of instruments
After the use, it is necessary to keep clean and blow up the dust as far as possible, so as to avoid the dust from polluting the mechanical precision parts, optical parts and electrical contact surface, resulting in the instrument precision reduction.
When cleaning, avoid directly throwing water to clean, wipe and blow dry with dust-free cloth. Do not touch the machine with hard objects to avoid failure or danger.
When cleaning the optical parts of the probe table, the lens paper can be dipped into anhydrous alcohol from the middle to wipe gently. When there is no water alcohol flammable, pay attention to the use of safety.
Please unplug the power cord to maintain the service life of the machine when the power is cut or used for a long time.
Operators must act strictly to ensure the accuracy of data and the normal use of instruments.
4. Working environment
The probe stand should be placed on a stable and reliable surface, preferably on a working table with an anti-vibration device, avoiding the use in high-temperature, humid, intense vibration, direct sunlight and dusty environment.
Using the optimum temperature range for 5 ℃ to 40 ℃, the best humidity is 40% to 40%, if the humidity below 30% in the air, reliable humidity controller to control, to maintain the range of 50% ~ 60%. When using door window closes as far as possible, make indoor achieve dehumidification effect.
Power supply: 220 + 10%, 50~60Hz
It specializes in the field of manual Probe station, Laser unpacker Laser decap, light emission microscope EMMI, IV automatic curve measurement, infrared microscope and other semiconductor failure analysis equipment
About the probe table